Day One: Hardware
Introduction
· Ion sources
· Mass analysers
· Detectors
· Examples of instruments
Ion optics
· Current and charge
· Electrostatic and Magnetic Fields
· Motion of charged particles
· Mass calibration and magnet control
· Geometric optics
· Focusing by electrostatic and magnetic sectors
· Energy (double) focusing
Measurement
· Peak shape
· Mass resolving power
· Nuclear mass defect
· Abundance sensitivity
· Faraday cups
Day Two: Calibration and Sample Preparation
Lecture 1: Introduction
Lecture 2: Reference Materials part I
Lecture 3: Reference Materials part II
Lecture 4. Methods for measuring U isotopic using TIMS and UF6 Mass spectrometry
Lecture 5. Isotope dilution and tracer calibration (mixed elemental and/or isotopic)
Lecture 6. Principles of sample analyses by microbeam methods (mainly LA-ICP-MS)
Lecture 7. Sample purification by ion exchange
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Short Course Dinner: Jamie’s Italian (top floor), 7.30 for 8.00.
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Day Three: Data reduction and Uncertainties
Lecture 1: the language of uncertainty, error, bias, precision, accuracy. What do they all mean?
Lecture 2: Measurement uncertainty-some basics
Lecture 3: Limits of detection, background evaluation and assessing performance
Lecture 4: Uncertainty/error propagation
Lecture 5: Over-determined systems
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